Open Pin Scan
Power-off Vectorless Test Techniques for SPEA's Flying Probe & Board Testers
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Test Data Analyser
Data collection, processing and analysis for SPEA Semiconductor Testers
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Test Results Manager
Test in automated way your boards without identification code
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August 2010
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Il TEAM SPEA con Maurino sul podio del C.I.T. Indoor di Varallo Sesia |
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May 2009
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Il logo del TEAM SPEA sulla prima di C.I. Hard Trial
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SPEA 为2009世界特技锦标赛命名 |
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浏览SPEA 世锦赛网站. |
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在社会责任上，SPEA 一直大力支持玻利维亚的慈幼会. |
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ELECTRONICS NEXT 2010
February, 24-26 2010Delhi - India |
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Apex IPC Show
April, 6-8 2010Las Vegas (NV) - USA |
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SMT HYBRID PACKAGING 2010
June, 8-10 2010Nürnberg - Germany |
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